发明名称 SEMICONDUCTOR DEVICE HAVING PLURAL PENETRATION ELECTRODES PENETRATING THROUGH SEMICONDUCTOR SUBSTRATE AND TESTING METHOD THEREOF
摘要 Disclosed herein is a device that includes first and second current paths, first and second latch circuits electrically connected to the first and second current paths, respectively, a driver circuit supplying first data to the first latch circuit, and supplying second data representing a logical value opposite to a logical value of the first data to the second latch circuit, a control circuit controlling the driver circuit to be alternately and repeatedly in a first period in which the driver circuit supplies the first data to the first latch circuit and does not supply the second data to the second latch circuit, and in a second period in which the driver circuit supplies the second data to the second latch circuit and does not supply the first data to the first latch circuit, and a monitor circuit.
申请公布号 US2012212272(A1) 申请公布日期 2012.08.23
申请号 US201213398702 申请日期 2012.02.16
申请人 ELPIDA MEMORY, INC. 发明人 YOKOU HIDEYUKI;SHIGEZANE YASUYUKI
分类号 H03K3/027;H03K3/00 主分类号 H03K3/027
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