发明名称 METHOD AND APPARATUS FOR CHARACTERIZING AND REDUCING PROXIMITY EFFECT ON CELL ELECTRICAL CHARACTERISTICS
摘要 <p>Circuit elements are characterized for effects of proximity context on electrical characteristic. Based on the characterization, proximity context cell models, and corresponding modeled electrical characteristic values are obtained. Logic cells are characterized and modeled according to the proximity context cell models. Optionally the electrical characteristic can be time delay, leakage, dynamic power, or coupling noise among other parameters.</p>
申请公布号 WO2012112625(A1) 申请公布日期 2012.08.23
申请号 WO2012US25139 申请日期 2012.02.14
申请人 QUALCOMM INCORPORATED;DATTA, ANIMESH;KAMAL, PRATYUSH;PATEL, PRAYAG B.;ZHANG, XIAONAN 发明人 DATTA, ANIMESH;KAMAL, PRATYUSH;PATEL, PRAYAG B.;ZHANG, XIAONAN
分类号 G06F17/50 主分类号 G06F17/50
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