发明名称 IMAGE PROCESSING DEVICE, MEASURING/TESTING SYSTEM, AND PROGRAM
摘要 The present invention provides a contour extraction technique capable of resolving not only spuriousness, duplication, or branches in the contours of a sample pattern, but also discontinuities in the contours. A thinning process is performed with respect to design data for generating a sample pattern, and pattern in/out definition information defining the inside and outside of a pattern formed on a target sample is generated. Then, based on the Marker Controlled Watershed Segmentation method, region segmentation is performed by expanding regions indicated by the pattern in/out definition information while referencing pixel values of an edge-enhanced image of a target sample image, and pattern contours are generated.
申请公布号 KR20120094044(A) 申请公布日期 2012.08.23
申请号 KR20127015558 申请日期 2010.12.17
申请人 HITACHI HIGH-TECHNOLOGIES CORPORATION 发明人 ABE YUICHI
分类号 G01N23/225;G06T1/00;H01L21/66 主分类号 G01N23/225
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