发明名称 SILICON ELECTRODE PLATE FOR PLASMA ETCHING
摘要 <P>PROBLEM TO BE SOLVED: To provide a silicon electrode plate for plasma etching, which suppresses surface irregularities caused by plasma etching to allow uniform etching. <P>SOLUTION: The silicon electrode plate for plasma etching is made of single crystal silicon to which B and Al have been added as dopants, and a concentration of Al is 1&times;10<SP POS="POST">13</SP>atoms/cm<SP POS="POST">3</SP>or more. In the silicon electrode plate for plasma etching, electrical characteristics of the single crystal silicon are uniformized in a plane. Therefore, when a surface of the silicon electrode plate for plasma etching is worn in plasma etching, irregularities can be extremely reduced, and cracking can be suppressed. <P>COPYRIGHT: (C)2012,JPO&INPIT
申请公布号 JP2012160570(A) 申请公布日期 2012.08.23
申请号 JP20110019180 申请日期 2011.01.31
申请人 MITSUBISHI MATERIALS CORP 发明人 YONEHISA TAKASHI;TAKAHATA KOTA
分类号 H01L21/3065 主分类号 H01L21/3065
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