发明名称 STRESS SENSOR FOR MEASURING MECHANICAL STRESSES IN A SEMICONDUCTOR CHIP AND STRESS COMPENSATED HALL SENSOR
摘要 A stress sensor (1) for detecting mechanical stress in a semiconductor chip (2) has a Wheatstone bridge formed by four integrated resistors R1 to R4, the resistors R1 and R4 being p-type resistors and the resistors R2 and R3 being n-type resistors.
申请公布号 US2012210800(A1) 申请公布日期 2012.08.23
申请号 US201213397803 申请日期 2012.02.16
申请人 HUBER SAMUEL;LAVILLE ARNAUD;LETEN WOUTER;SCHOTT CHRISTIAN;MELEXIS TECHNOLOGIES NV 发明人 HUBER SAMUEL;LAVILLE ARNAUD;LETEN WOUTER;SCHOTT CHRISTIAN
分类号 G01B7/24;G01B7/16 主分类号 G01B7/24
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