发明名称 |
STRESS SENSOR FOR MEASURING MECHANICAL STRESSES IN A SEMICONDUCTOR CHIP AND STRESS COMPENSATED HALL SENSOR |
摘要 |
A stress sensor (1) for detecting mechanical stress in a semiconductor chip (2) has a Wheatstone bridge formed by four integrated resistors R1 to R4, the resistors R1 and R4 being p-type resistors and the resistors R2 and R3 being n-type resistors. |
申请公布号 |
US2012210800(A1) |
申请公布日期 |
2012.08.23 |
申请号 |
US201213397803 |
申请日期 |
2012.02.16 |
申请人 |
HUBER SAMUEL;LAVILLE ARNAUD;LETEN WOUTER;SCHOTT CHRISTIAN;MELEXIS TECHNOLOGIES NV |
发明人 |
HUBER SAMUEL;LAVILLE ARNAUD;LETEN WOUTER;SCHOTT CHRISTIAN |
分类号 |
G01B7/24;G01B7/16 |
主分类号 |
G01B7/24 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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