A UNIFICATION APPARATUS AND METHOD FOR THICKNESS MEASUREMENT AND THICKNESS REDUCTION EVALUATION

摘要

PURPOSE: A device and a method for measuring a thickness and evaluating a thickness reduction are provided to measure a residual thickness by focusing on a local portion where a thickness reduction is actually generated because a thickness can be measured by selecting a dense grid and partial grid. CONSTITUTION: A device for measuring a thickness and evaluating a thickness reduction comprises a thickness measuring unit(100) and a thickness evaluation unit(200). The thickness measuring unit measures a thickness of between the inside and the outside of an object. The thickness measuring unit saves the measured thickness as a thickness value. The thickness evaluation unit evaluates a thickness reduction amount, a thickness reduction speed, a residual lifetime, and the soundness of the object based on basic data of the object being input from the outside and the thickness value.