发明名称 Methods Of Forming A Vertical Transistor And At Least A Conductive Line Electrically Coupled Therewith, Methods Of Forming Memory Cells, And Methods Of Forming Arrays Of Memory Cells
摘要 Trenches are formed into semiconductive material. Masking material is formed laterally over at least elevationally inner sidewall portions of the trenches. Conductivity modifying impurity is implanted through bases of the trenches into semiconductive material there-below. Such impurity is diffused into the masking material received laterally over the elevationally inner sidewall portions of the trenches and into semiconductive material received between the trenches below a mid-channel portion. An elevationally inner source/drain is formed in the semiconductive material below the mid-channel portion. The inner source/drain portion includes said semiconductive material between the trenches which has the impurity therein. A conductive line is formed laterally over and electrically coupled to at least one of opposing sides of the inner source/drain. A gate is formed elevationally outward of and spaced from the conductive line and laterally adjacent the mid-channel portion. Other embodiments are disclosed.
申请公布号 US2012214285(A1) 申请公布日期 2012.08.23
申请号 US201113031829 申请日期 2011.02.22
申请人 GUHA JAYDIP;SURTHI SHYAM;MATHEW SURAJ J.;KARDA KAMAL M.;TSAI HUNG-MING 发明人 GUHA JAYDIP;SURTHI SHYAM;MATHEW SURAJ J.;KARDA KAMAL M.;TSAI HUNG-MING
分类号 H01L21/336 主分类号 H01L21/336
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