发明名称 METHOD FOR FABRICATING A DUAL POLYGATE IN SEMICONDUCTOR DEVICE
摘要 <p>PURPOSE: A dual-poly gate formation method of a semiconductor device is provided to reduce electrical deterioration due to lattice defects induced within a silicon lattice using silicon which is same material with the silicon within a poly-silicon layer. CONSTITUTION: A gate insulating layer and a poly-silicon layer(110) are formed on a semiconductor substrate(100) having a first area(A) and a second area(B). The poly-silicon layer of the second area is exposed. A first ion injection process which makes the poly-silicon layer of the second area amorphous is executed. A second ion injection process which dopes impurities of second conductive type on the poly-silicon layer of the second area is executed. Impurities of the first area and the second area are activated by heat-treating the semiconductor substrate.</p>
申请公布号 KR20120092948(A) 申请公布日期 2012.08.22
申请号 KR20110012893 申请日期 2011.02.14
申请人 SK HYNIX INC. 发明人 CHA, JAE CHUN;JIN, SEUNG WOO;LEE, AN BAE;JOO, YUNG HWAN;JANG, IL SIK
分类号 H01L21/8238;H01L21/336;H01L29/78 主分类号 H01L21/8238
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