发明名称 Method of forming a memory cell that employs a selectively deposited reversible resistance-switching element
摘要 <p>In some aspects, a method of forming a memory cell is provided that includes forming a first conductor above a substrate; forming a diode above the first conductor; forming a reversible resistance-switching element above the first conductor using a selective deposition process; and forming a second conductor above the diode and the reversible resistance-switching element. Numerous other aspects are provided. </p>
申请公布号 EP2485258(A3) 申请公布日期 2012.08.22
申请号 EP20120166461 申请日期 2008.06.27
申请人 SANDISK 3D LLC 发明人 SCHRICKER, APRIL;HERNER, S. BRAD;KONEVECKI, MICHAEL W.
分类号 H01L27/10;H01L27/24 主分类号 H01L27/10
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