发明名称 |
Method of forming a memory cell that employs a selectively deposited reversible resistance-switching element |
摘要 |
<p>In some aspects, a method of forming a memory cell is provided that includes forming a first conductor above a substrate; forming a diode above the first conductor; forming a reversible resistance-switching element above the first conductor using a selective deposition process; and forming a second conductor above the diode and the reversible resistance-switching element. Numerous other aspects are provided.
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申请公布号 |
EP2485258(A3) |
申请公布日期 |
2012.08.22 |
申请号 |
EP20120166461 |
申请日期 |
2008.06.27 |
申请人 |
SANDISK 3D LLC |
发明人 |
SCHRICKER, APRIL;HERNER, S. BRAD;KONEVECKI, MICHAEL W. |
分类号 |
H01L27/10;H01L27/24 |
主分类号 |
H01L27/10 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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