发明名称 CMOS image sensor
摘要 Disclosed is a CMOS image sensor and a manufacturing method thereof. According to an aspect of the present invention, each pixel of CMOS image sensor includes a photo detector that includes an electon Collection layer doped with a concentration of 5×1015/cm3 to 2×1016/cm3; and a transfer transistor that is connected to the photo detector and is formed of a vertical type trench gate of which the equivalent oxide thickness is 120 Å or more.
申请公布号 US8247854(B2) 申请公布日期 2012.08.21
申请号 US20100899473 申请日期 2010.10.06
申请人 KANG JIN YEONG;ELECTRONICS AND TELECOMMUNICATIONS RESEARCH INSTITUTE 发明人 KANG JIN YEONG
分类号 H01L31/062 主分类号 H01L31/062
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