发明名称 Method of fabricating a complementary metal oxide semiconductor (CMOS) image sensor
摘要 There are provided a CMOS image sensor and a method for fabrication thereof. The CMOS image sensor having a reset transistor, a select transistor, a drive transistor and a photodiode, includes an active region in shape of a line, a gate electrode of the drive transistor, which is intersected with the active region, a blocking layer interposed between the active region and the gate electrode in which the blocking layer is formed on an intersection region of the active region and the gate electrode, and a metal contact electrically connected to the gate electrode, wherein the metal contact is not electrically connected to the active region by the blocking layer.
申请公布号 US8247256(B2) 申请公布日期 2012.08.21
申请号 US20100970547 申请日期 2010.12.16
申请人 HO WON-JOON;LEE KYUNG-LAK;INTELLECTUAL VENTURES II LLC 发明人 HO WON-JOON;LEE KYUNG-LAK
分类号 H01L21/00;H01L27/146;H04N5/335;H04N5/374 主分类号 H01L21/00
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