发明名称 FABRICATING METHOD OF NON VOLATILE MEMORY DEVICE AND NON VOLATILE MEMORY DEVICE THEREBY
摘要 <p>PURPOSE: A method for manufacturing a nonvolatile memory device is provided to remove an air gap filling process in a part of an area by selectively forming an air gap in a first area. CONSTITUTION: A substrate with a first region and a second region is provided. A first dielectric layer(120) and a charge storage floating pattern(130) are successively laminated on the substrate. A plurality of trenches(105) is filled with first insulation materials. A first recess is formed in the first area by removing the first insulation materials of the first area. A second insulation material(160) is formed on the upper side of the first recess. An air gap(110) is formed on the lower side of the first recess by removing sacrificial materials.</p>
申请公布号 KR20120091621(A) 申请公布日期 2012.08.20
申请号 KR20110011497 申请日期 2011.02.09
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 LEE, DONG SIK;YOU, JANG HYUN;HAN, JEE HOON;PARK, YOUNG WOO;HUR, SUNG HOI;JOO, SANG ICK
分类号 H01L21/8247;H01L27/115 主分类号 H01L21/8247
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