FABRICATING METHOD OF NON VOLATILE MEMORY DEVICE AND NON VOLATILE MEMORY DEVICE THEREBY
摘要
<p>PURPOSE: A method for manufacturing a nonvolatile memory device is provided to remove an air gap filling process in a part of an area by selectively forming an air gap in a first area. CONSTITUTION: A substrate with a first region and a second region is provided. A first dielectric layer(120) and a charge storage floating pattern(130) are successively laminated on the substrate. A plurality of trenches(105) is filled with first insulation materials. A first recess is formed in the first area by removing the first insulation materials of the first area. A second insulation material(160) is formed on the upper side of the first recess. An air gap(110) is formed on the lower side of the first recess by removing sacrificial materials.</p>
申请公布号
KR20120091621(A)
申请公布日期
2012.08.20
申请号
KR20110011497
申请日期
2011.02.09
申请人
SAMSUNG ELECTRONICS CO., LTD.
发明人
LEE, DONG SIK;YOU, JANG HYUN;HAN, JEE HOON;PARK, YOUNG WOO;HUR, SUNG HOI;JOO, SANG ICK