发明名称 RESIST COMPOSITION AND PATTERNING PROCESS
摘要 <p>PURPOSE: A resist material and a pattern forming method using the same are provided to improve the shape of pattern after exposure and to improve sensitivity and resolution. CONSTITUTION: A resist material includes a polymeric compound which is obtained by copolymerizing a first repeating unit(a1) of acid labile group substituted (meta)acrylate, styrene carboxylic acid, or vinyl naphthalene carboxylic acid, and/or a second repeating unit(a2) containing acid labile group substituted phenolic hydroxyl group, and a third repeating unit(b1) of (meta)acrylate of magnesium, copper, zinc, or cesium or the salts of styrene carboxylic acid or vinyl naphthalene carboxylic acid. The polymeric compound is represented by chemical formula 1.</p>
申请公布号 KR20120092041(A) 申请公布日期 2012.08.20
申请号 KR20120012616 申请日期 2012.02.08
申请人 SHIN-ETSU CHEMICAL CO., LTD. 发明人 HATAKEYAMA JUN
分类号 G03F7/039;G03F7/004;G03F7/027 主分类号 G03F7/039
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