发明名称 THREE DIMENSIONAL SEMICONDUCTOR MEMORY DEVICE AND METHOD OF FABRICATING THE SAME
摘要 <p>PURPOSE: A 3D semiconductor device and a manufacturing method thereof are provided to reduce a leakage current by decoupling a common source line from a substrate through a buried insulating layer. CONSTITUTION: A buffer layer(4) is formed on a substrate. The buffer layer comprises a buried insulation layer and a semiconductor layer. The semiconductor layer is formed on the buried insulation layer. A common source line is located inside the semiconductor layer. A plurality of conductive patterns is laminated on the buffer layer. Inter-layer insulation patterns(21a-28a) are arranged between the conductive patterns. Activity patterns contact with the buffer layer by passing through the plurality of conductive patterns and the inter-layer insulation patterns.</p>
申请公布号 KR20120090356(A) 申请公布日期 2012.08.17
申请号 KR20110010729 申请日期 2011.02.07
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 CHANG, SUNG IL;LEE, CHANG HYUN;SON, BYOUNG KEUN;LIM, JIN SOO
分类号 H01L27/115;H01L21/8247 主分类号 H01L27/115
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