发明名称 DEVICE FOR MEASURING QUANTITY OF SUBSTRATE
摘要 PURPOSE: A device for measuring the number of substrates is provided to reduce manufacturing costs and to enhance product reliability and productivity by measuring the number of substrates rapidly, accurately, and conveniently. CONSTITUTION: A device(100) for measuring the number of substrates comprises a scan unit(110) and a detection unit(120). The scan unit laser-scans a substrate laminating body(10) in which a plurality of substrates is laminated in a side of the substrate laminating body along a direction of laminating the substrates. The scan unit generates beams for signals to measure the number of the laminated substrates. The detection unit receives the beams, thereby detecting the number of the substrates. Resin layers of each substrate are exposed to a lateral surface. The beams for the signal are fluorescence beams.
申请公布号 KR20120090287(A) 申请公布日期 2012.08.17
申请号 KR20110010635 申请日期 2011.02.07
申请人 SAMSUNG ELECTRO-MECHANICS CO., LTD. 发明人 KIM, TAK GYUM;PARK, SOO WOONG;LEE, CHANG JU
分类号 G01B11/00;G06M9/00 主分类号 G01B11/00
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