SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING A SEMICONDUCTOR DEVICE
摘要
PURPOSE: A semiconductor device and a manufacturing method thereof are provided to prevent contact failure between a penetrating electrode and a top wire by executing a BEOL(Back End Of Line) process after forming the penetrating electrode on a substrate. CONSTITUTION: Circuit patterns are formed on a substrate. An inter-layer insulating film(14) covers the circuit patterns. A first inter-metal insulating film(30) is located on the inter-layer insulating film. A second inter-metal insulating film(40) is located on the first inter-metal insulating film. The second inter-metal insulating film comprises a second top contact(44) and a second top wire(52). The second top contact is electrically connected to a first top contact. The second top wire is electrically connected to a first top wire and has one or more conductive lines.
申请公布号
KR20120090417(A)
申请公布日期
2012.08.17
申请号
KR20110010835
申请日期
2011.02.08
申请人
SAMSUNG ELECTRONICS CO., LTD.
发明人
YUN, KI YOUNG;PARK, YEONG LYEOL;BAE, KI SOON;LEE, WOON SEOB;CHO, SUNG DONG;KANG, SIN WOO;JI, SANG WOOK;KIM, EUN JI