发明名称 X-RAY INSPECTION DEVICE AND METHOD
摘要 <p>An X-ray inspection device is provided with an X-ray irradiation unit (10) for irradiating an object (1) with X rays from a plurality of directions and capturing a plurality of X-ray transmission images having a disparity therebetween, and an image processing unit (20) for inspecting the object (1) from the plurality of X-ray transmission images. By the image processing unit which uses, for example, an evolutionary computation method, edges of the object (1) are associated, both ends of the edge of the object (1) is determined (S2-S7), and then the position of the object (1) is measured in three dimensions (S8).</p>
申请公布号 WO2012108278(A1) 申请公布日期 2012.08.16
申请号 WO2012JP51749 申请日期 2012.01.27
申请人 IHI INSPECTION AND INSTRUMENTATION CO., LTD.;NATIONAL UNIVERSITY CORPORATION YOKOHAMA NATIONALUNIVERSITY;NAGAO TOMOHARU;YADA NORIKO;TAKATA YUJIRO;MORITA MIKI;SAKAI YASUO;NOMURA HIROSHI 发明人 NAGAO TOMOHARU;YADA NORIKO;TAKATA YUJIRO;MORITA MIKI;SAKAI YASUO;NOMURA HIROSHI
分类号 G01N23/04;G01B15/04 主分类号 G01N23/04
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