发明名称 Pattern Matching Method and Pattern Matching Apparatus
摘要 Provided is a template matching method and a template matching apparatus, where the degree of matching between a template and the actual image upon template matching is maintained at a high level, without depending on a partial appearance of a lower layer. Proposed as one embodiment, is a method and an apparatus for template matching, where either an area is set in which comparison of the template and the image is not conducted, or a second area is set inside the template where comparison different from comparison conducted in a first comparison area is to be conducted, and the template matching is conducted on the basis either of comparison excluding the non-comparison area, or of comparison using the first and second areas.
申请公布号 US2012207397(A1) 申请公布日期 2012.08.16
申请号 US201013502823 申请日期 2010.10.06
申请人 HITACHI HIGH-TECHNOLOGIES CORPORATION 发明人 NAGATOMO WATARU;ABE YUICHI;IKEDA MITSUJI
分类号 G06K9/68 主分类号 G06K9/68
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