发明名称 SYSTEM AND METHOD OF REFERENCE CELL TESTING
摘要 In a particular embodiment, a method of testing a reference cell in a memory array includes coupling a first reference cell of a first reference cell pair of the memory array to a first input of a first sense amplifier of the memory array. The method also includes providing a reference signal to a second input of the first sense amplifier. The reference signal is associated with a second reference cell pair of the memory array.
申请公布号 WO2012027291(A3) 申请公布日期 2012.08.16
申请号 WO2011US48672 申请日期 2011.08.22
申请人 QUALCOMM INCORPORATED;KIM, JUNG PILL;KIM, TAE HYUN;RAO, HARI M. 发明人 KIM, JUNG PILL;KIM, TAE HYUN;RAO, HARI M.
分类号 G11C29/24 主分类号 G11C29/24
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