In a particular embodiment, a method of testing a reference cell in a memory array includes coupling a first reference cell of a first reference cell pair of the memory array to a first input of a first sense amplifier of the memory array. The method also includes providing a reference signal to a second input of the first sense amplifier. The reference signal is associated with a second reference cell pair of the memory array.
申请公布号
WO2012027291(A3)
申请公布日期
2012.08.16
申请号
WO2011US48672
申请日期
2011.08.22
申请人
QUALCOMM INCORPORATED;KIM, JUNG PILL;KIM, TAE HYUN;RAO, HARI M.