发明名称 PATTERN OBSERVATION APPARATUS, RECIPE PREPARATION APPARATUS, AND RECIPE PREPARATION METHOD
摘要 <P>PROBLEM TO BE SOLVED: To prepare a recipe required for imaging of an image of a review apparatus with high efficiency in order to identify any of possible causes of failure positions, based on the result of a failure analysis system. <P>SOLUTION: A pattern observation apparatus or a recipe preparation apparatus connected to the pattern observation apparatus has a recipe preparation section for setting imaging conditions of an image so as to pick up the image, based on wiring information including a failure position input from a failure analysis system connected with the pattern observation apparatus through a network, along wiring including the failure position. <P>COPYRIGHT: (C)2012,JPO&INPIT
申请公布号 JP2012156410(A) 申请公布日期 2012.08.16
申请号 JP20110015902 申请日期 2011.01.28
申请人 HITACHI HIGH-TECHNOLOGIES CORP 发明人 SAKAI TSUNEHIRO;HAMAMURA YUICHI
分类号 H01L21/66;G01N23/225 主分类号 H01L21/66
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