发明名称 |
PATTERN OBSERVATION APPARATUS, RECIPE PREPARATION APPARATUS, AND RECIPE PREPARATION METHOD |
摘要 |
<P>PROBLEM TO BE SOLVED: To prepare a recipe required for imaging of an image of a review apparatus with high efficiency in order to identify any of possible causes of failure positions, based on the result of a failure analysis system. <P>SOLUTION: A pattern observation apparatus or a recipe preparation apparatus connected to the pattern observation apparatus has a recipe preparation section for setting imaging conditions of an image so as to pick up the image, based on wiring information including a failure position input from a failure analysis system connected with the pattern observation apparatus through a network, along wiring including the failure position. <P>COPYRIGHT: (C)2012,JPO&INPIT |
申请公布号 |
JP2012156410(A) |
申请公布日期 |
2012.08.16 |
申请号 |
JP20110015902 |
申请日期 |
2011.01.28 |
申请人 |
HITACHI HIGH-TECHNOLOGIES CORP |
发明人 |
SAKAI TSUNEHIRO;HAMAMURA YUICHI |
分类号 |
H01L21/66;G01N23/225 |
主分类号 |
H01L21/66 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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