发明名称 SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE SAME
摘要 <P>PROBLEM TO BE SOLVED: To provide a semiconductor device excellent in device properties and a method of manufacturing the same. <P>SOLUTION: A semiconductor device according to an embodiment comprises a function film including a first region and a second region, a first groove provided in the first region of the substrate and having a first width, a second groove provided in the second region of the substrate and having a second width greater than the first width, a first insulating film formed so as to fill the first groove using a high-polymer material as a precursor, fine particles each having a diameter greater than the first width and configured to fill the second groove, and a second insulating film formed so as to fill a gap between the fine particles in the second groove and a gap between the fine particles and the second groove using the high-polymer material as a precursor. <P>COPYRIGHT: (C)2012,JPO&INPIT
申请公布号 JP2012156392(A) 申请公布日期 2012.08.16
申请号 JP20110015596 申请日期 2011.01.27
申请人 TOSHIBA CORP 发明人 NAKAZAWA KEISUKE
分类号 H01L21/76;H01L21/316;H01L21/336;H01L21/8242;H01L21/8246;H01L21/8247;H01L27/10;H01L27/105;H01L27/108;H01L27/115;H01L29/788;H01L29/792;H01L45/00;H01L49/00 主分类号 H01L21/76
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