发明名称 SEMICONDUCTOR WAFER, SEMICONDUCTOR BAR, METHOD OF MANUFACTURING SEMICONDUCTOR WAFER, METHOD OF MANUFACTURING SEMICONDUCTOR BAR, AND METHOD OF MANUFACTURING SEMICONDUCTOR ELEMENT
摘要 <P>PROBLEM TO BE SOLVED: To provide a semiconductor wafer in which a good crack can be formed by scribing, and to provide a semiconductor bar, a method of manufacturing the semiconductor wafer, a method of manufacturing the semiconductor bar, and a method of manufacturing a semiconductor element. <P>SOLUTION: By using an epitaxial growth layer of a semiconductor wafer, a plurality of optical semiconductor elements (more specifically, semiconductor lasers) are formed side by side in a surface direction of the semiconductor wafer. An InGaAs epitaxial layer is provided continuously between the optical semiconductor elements, and a part (more specifically, an aperture or a groove) for exposing a layer underlying the InGaAs epitaxial layer at least to a layer overlying the InGaAs epitaxial layer is provided. A vertically progressing crack can be formed by performing the scribing along this part. <P>COPYRIGHT: (C)2012,JPO&INPIT
申请公布号 JP2012156228(A) 申请公布日期 2012.08.16
申请号 JP20110012764 申请日期 2011.01.25
申请人 MITSUBISHI ELECTRIC CORP 发明人 NEGISHI MASAHITO
分类号 H01L21/301;H01S5/323 主分类号 H01L21/301
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