发明名称 SEMICONDUCTOR DEVICE AND RELATED FABRICATION METHODS
摘要 <p>Semiconductor device structures and related fabrication methods are provided. An exemplary semiconductor device structure (100) includes a trench gate structure (114), a body region (124) adjacent to the trench gate structure (114), a drain region (125) adjacent to the trench gate structure (1 14) underlying the body region (124), a source region (130) formed within the body region (124), and a lateral gate structure (1 18) overlying a first portion of the body region (124). The first portion of the body region (124) is disposed between the trench gate structure (114) and the source region (130). In one embodiment, a corner region (128) is formed within the body region (124) adjacent to the trench gate structure (114), such that the first portion of the body region (124) is disposed between the corner region and the source region (130), and a second portion of the body region (124) adjacent to the trench gate structure (114) is disposed between the corner region (128) and the drain region (125).</p>
申请公布号 WO2012106833(A1) 申请公布日期 2012.08.16
申请号 WO2011CN00219 申请日期 2011.02.12
申请人 FREESCALE SEMICONDUCTOR, INC. ARE;WANG, PEILIN;CHEN, JINGJING;EDOUARD, D, DEFRESART 发明人 WANG, PEILIN;CHEN, JINGJING;EDOUARD, D, DEFRESART
分类号 H01L29/78;H01L21/336 主分类号 H01L29/78
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