发明名称 APPARATUS FOR TREATING SUBSTRATE
摘要 <P>PROBLEM TO BE SOLVED: To provide an apparatus for treating a substrate, which can immerse the whole part of a workpiece into a treatment liquid by the rotation of a holder and evenly treat the whole region of the workpiece to enable the whole region of the workpiece to be used as a product. <P>SOLUTION: The apparatus for treating a substrate includes: a treatment vessel 1 for accommodating the treatment liquid 4 for treating a wafer 5; the holder 30 for holding the wafer 5 without gripping the wafer in a position on the circumference of a circle having a radius larger than a distance between the center and the outermost position of the wafer 5, to immerse the wafer 5 into the treatment liquid 4; and a rotary device 101 for rotating the holder 30 by setting the center of the circumference as a rotary center thereof. <P>COPYRIGHT: (C)2012,JPO&INPIT
申请公布号 JP2012153914(A) 申请公布日期 2012.08.16
申请号 JP20110011696 申请日期 2011.01.24
申请人 MITSUBISHI ELECTRIC CORP 发明人 KAWASHITA RYUTA;MASUDA AKIO
分类号 C23C18/31 主分类号 C23C18/31
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