发明名称 CAPACITOR ARRAY SCREENING METHOD
摘要 <p>Provided is a capacitor array screening method with which it is possible to screen capacitor arrays that include a plurality of capacitor elements having different equivalent series resistances. This screening method involves: a contact step of bringing a pair of measurement terminals (60, 61) into contact with external electrodes (23, 33) provided on one side surface (12) of a capacitor array (10) and external electrodes (24, 34) provided on another side surface (13) thereof; a connection step of connecting the capacitor array (10) in parallel to a capacitor (70); a measurement step of applying an alternating-current signal between the pair of measurement terminals (60, 61) and measuring the impedance at the resonant frequency of the capacitor array (10), which is connected in parallel to the capacitor (70), and the impedance at the anti-resonant frequency thereof; and a screening step of determining that the capacitor array (10) is non-defective if the impedance at the resonant frequency is lower than or equal to a first threshold and the impedance at the anti-resonant frequency is lower than or equal to a second threshold.</p>
申请公布号 WO2012108123(A1) 申请公布日期 2012.08.16
申请号 WO2012JP00078 申请日期 2012.01.10
申请人 MURATA MANUFACTURING CO., LTD.;ICHIMURA, TAKASHI;YAMANAGA, KO;AZUMA, TAKAHIRO 发明人 ICHIMURA, TAKASHI;YAMANAGA, KO;AZUMA, TAKAHIRO
分类号 H01G13/00;G01R27/02;G01R31/00 主分类号 H01G13/00
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