发明名称 |
MASK BLANK FOR FPD DEVICE MANUFACTURE, PHOTOMASK, AND DESIGNING METHOD OF MASK BLANK FOR FPD DEVICE MANUFACTURE |
摘要 |
<P>PROBLEM TO BE SOLVED: To provide a mask blank and a photomask which are suitable to processes (a drawing method and a resist coating method) of a large-sized mask for FPD and different conditions (the kind of resist and resist film thickness). <P>SOLUTION: There is provided a mask blank for FPD device manufacture which at least has a light shield film on a translucent substrate and is used to form a resist film for laser drawing on the light shielding film by a slit coater device. The light shielding film is controlled to have a width of variation in film surface reflection factor within a range of less than 2% in a wavelength band of 350-450 nm including a laser drawing wavelength. The slit coater device forms the resist film by moving a nozzle, having a resist liquid supply port extending in one direction, relatively to a top surface of the light shielding film in a direction crossing the one direction while discharging the resist liquid from the nozzle. <P>COPYRIGHT: (C)2012,JPO&INPIT |
申请公布号 |
JP2012155334(A) |
申请公布日期 |
2012.08.16 |
申请号 |
JP20120088097 |
申请日期 |
2012.04.09 |
申请人 |
HOYA CORP;HOYA ELECTRONICS MALAYSIA SDN BHD |
发明人 |
MITSUI MASARU;SANO MICHIAKI |
分类号 |
G03F1/50;G03F1/54;H01L21/027 |
主分类号 |
G03F1/50 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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