发明名称 LIQUID PROCESSING METHOD, LIQUID PROCESSING APPARATUS, AND STORAGE MEDIUM
摘要 <P>PROBLEM TO BE SOLVED: To provide a liquid processing method in which an etching rate is large, and an etching selection ratio of a silicon nitride is higher than that of a silicon oxide; a liquid processing apparatus; and a storage medium storing the method. <P>SOLUTION: When etching a substrate from which a silicon nitride and a silicon oxide are exposed by an etching solution, this liquid processing method includes: preparing the etching solution by mixing a fluorine ion source, water and a boiling point regulating agent; maintaining a temperature of the etching solution to a temperature of 140&deg;C or higher for a predetermined time so that an etching rate of the silicon nitride becomes 100 &angst;/minute or more and a ratio of the etching rate of the silicon nitride to the etching rate of the silicon oxide becomes 75 or more, when etching the substrate by the etching solution; and then etching the substrate by the etching solution. <P>COPYRIGHT: (C)2012,JPO&INPIT
申请公布号 JP2012156270(A) 申请公布日期 2012.08.16
申请号 JP20110013473 申请日期 2011.01.25
申请人 TOKYO ELECTRON LTD 发明人 ONO HIROMOTO;ORII TAKEHIKO
分类号 H01L21/306;H01L21/308 主分类号 H01L21/306
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