| 摘要 |
We describe a system for characterising the dielectric properties of the surface of a material, the system comprising: a piezoelectric probe for interrogating a surface of said material; an RF drive unit configured to excite electroacoustic oscillations in said piezoelectric probe; and a signal analysis system, coupled to said piezoelectric probe, to output data characterising a dielectric property of said material responsive to said excited electroacoustic oscillations. |
