发明名称 Probe device
摘要 A probe device for optically measuring a condition of an object includes a light emitter for emitting a light to proceed into the object through a surface of the object, a light sensor for measuring an optical condition of the light proceeding from the surface through the object and subsequently emitted from the surface to reach the light sensor, and a body holding thereon at least one of the light emitter and the light sensor. The body includes at least one main protrusion protruding so as to face to the surface, and at least two sub-protrusions arranged around the at least one main protrusion and protruding so as to face to the surface.
申请公布号 US8244326(B2) 申请公布日期 2012.08.14
申请号 US20070940341 申请日期 2007.11.15
申请人 NINOMIYA ATSUSHI;KASAI YOSHIMI;HIRABAYASHI YUKIKO;HITACHI, LTD. 发明人 NINOMIYA ATSUSHI;KASAI YOSHIMI;HIRABAYASHI YUKIKO
分类号 A61B5/1455 主分类号 A61B5/1455
代理机构 代理人
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