发明名称 SPUTTERING TARGET, METHOD FOR MANUFACTURING THE SAME, AND METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE
摘要 <p>PURPOSE: A sputtering target, a manufacturing method of the sputtering target, and a manufacturing method of a semiconductor device are provided to increase the ratio of heavy rare gases in sputtering gas by securing a desired concentration of nitrogen in a target, thereby improving productivity in a semiconductor device manufacturing process. CONSTITUTION: A sputtering target comprises an oxynitride sintered body(11) containing two or more of indium, gallium, zinc, and tin. In the sintered body, the concentration of nitrogen is 4 atomic% or greater, the concentration of alkali metal is 5×10^16atoms/cm^3 or less, and the concentration of hydrogen is 1×10^16atoms/cm^3 or less.</p>
申请公布号 KR20120089795(A) 申请公布日期 2012.08.13
申请号 KR20110136200 申请日期 2011.12.16
申请人 SEMICONDUCTOR ENERGY LABORATORY CO., LTD. 发明人 YAMAZAKI SHUNPEI
分类号 C23C14/34;C04B35/58;H01L21/203 主分类号 C23C14/34
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