发明名称 EVALUATION METHOD OF OPTICAL ANISOTROPIC FILM, MEASURING APPARATUS FOR OPTICAL CHARACTERISTICS OF OPTICAL ANISOTROPIC FILM AND MANUFACTURING METHOD OF OPTICAL ANISOTROPIC FILM
摘要 <P>PROBLEM TO BE SOLVED: To provide an evaluation method with which whether a traveling long optical anisotropic film can obtain desired optical characteristics can be measured in an in-line state, a measuring apparatus for enabling such an evaluation method, and a method of manufacturing the optical anisotropic film having the desired optical characteristics using a result of the evaluation. <P>SOLUTION: An evaluation method of an optical anisotropic film is provided. The method includes a step of radiating light in a direction being vertical to the optical anisotropic film and having an azimuth angle -5&deg; to +5&deg; and a polar angle &theta;<SB POS="POST">1</SB>(30&deg;&le;&theta;<SB POS="POST">1</SB>&le;70&deg;) with respect to an in-plane delay phase axial direction and in a direction having an azimuth angle &theta;<SB POS="POST">2</SB>(30&deg;&le;&theta;<SB POS="POST">2</SB>&le;60&deg;) and a polar angle &theta;<SB POS="POST">3</SB>(30&deg;&le;&theta;<SB POS="POST">3</SB>&le;70&deg;) with respect to the in-plane delay phase axial direction and measuring a change in transmission polarization state, respectively, and a step of comparing the measurement with a change in transmission polarization state obtained by performing the similar measurement on an optical anisotropic film having desired optical characteristics. <P>COPYRIGHT: (C)2012,JPO&INPIT
申请公布号 JP2012150107(A) 申请公布日期 2012.08.09
申请号 JP20110285145 申请日期 2011.12.27
申请人 NIPPON ZEON CO LTD 发明人 RA HUNGU CHIONGU;SATO TAKASHI
分类号 G01N21/23;G02B5/30 主分类号 G01N21/23
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