发明名称 MANUFACTURING METHOD OF SEMICONDUCTOR DEVICE
摘要 <P>PROBLEM TO BE SOLVED: To provide a semiconductor device accelerated in switching speed of a transistor. <P>SOLUTION: A semiconductor device comprises: a semiconductor layer 10 formed on a part of an insulating layer; a first transistor 20 formed on a side surface 10a of the semiconductor layer 10 and including a first gate insulating film 21, a first gate electrode 22, and two first impurity layers 23, 24 that become a source and a drain; and a second transistor 30 formed on a side surface 10b of the semiconductor layer 10 and including a second gate insulating film 31, a second gate electrode 32, and two second impurity layers 33, 34 that become a source and a drain. <P>COPYRIGHT: (C)2012,JPO&INPIT
申请公布号 JP2012151496(A) 申请公布日期 2012.08.09
申请号 JP20120069559 申请日期 2012.03.26
申请人 INCORPORATED EDUCATIONAL INSTITUTION MEISEI 发明人 OTSUKA KANJI;MIZUNO FUMIO;TAKANO YOSHIKAZU;USAMI TAMOTSU
分类号 H01L29/786;H01L21/8234;H01L27/08;H01L27/088 主分类号 H01L29/786
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