发明名称 PLASMA PROCESS DEVICE
摘要 <P>PROBLEM TO BE SOLVED: To provide a plasma process device capable of suppressing a film formed on a surface of a member inside a processing chamber from peeling. <P>SOLUTION: A plasma process device comprises: a processing chamber 1; a first electrode 4 in which a processed substrate 3 is placed in the processing chamber 1; a second electrode 2 facing in parallel with the first electrode 4 in the processing chamber 1; processing gas supply means 8 for supplying a desired processing gas to a processing space between the first electrode 4 and the second electrode 2; exhaust means for performing exhaust and pressure adjustment in the processing chamber 1; and a power supply 7 which supplies a voltage for generating a plasma of the processing gas by supplying electric power to the processing space to the second electrode 2. The first electrode 4 includes a dug part 4a in at least a part of a region other than a placement region on a surface on the side on which the processed substrate 3 is placed. <P>COPYRIGHT: (C)2012,JPO&INPIT
申请公布号 JP2012151180(A) 申请公布日期 2012.08.09
申请号 JP20110007121 申请日期 2011.01.17
申请人 MITSUBISHI ELECTRIC CORP 发明人 TANIGUCHI TOMOYUKI;ASANO SATONARI;KAWASAKI TAKAHIRO
分类号 H01L21/31;C23C16/458;C23C16/509;H01L21/3065 主分类号 H01L21/31
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