| 摘要 |
<p>Provided are a measurement error correction method and an electronic component characteristic measurement device extendable to an arbitrary number of ports and capable of dispensing with VNA correction while obtaining the effect of a relative correction method which models a leak signal of between ports. For correction data acquisition samples having mutually different electrical characteristics, electrical characteristics SD and ST are measured in a state (40) mounted on a reference jig and in a state (50) mounted on a test jig, and for each signal source port a numerical formula (52) is determined which, given a measurement system which includes a measurement instrument for measuring electrical characteristics, assumes the existence of a leak signal directly transmitted between at least two ports of the reference jig and/or the test jig. The electrical characteristics of an arbitrary electronic component are measured in a state (50) mounted on the test jig, and the determined numerical formula (52) is used to calculate the electrical characteristics that would probably be obtained if said electronic component were to be measured in a state (40) mounted on the reference jig.</p> |
