发明名称 SPECTRAL SIGNAL-TO-NOISE RATIO TEST FOR X-RAY IMAGING
摘要 <p>The present invention relates to a test object for X-ray imaging, an X-ray imaging system, a method for testing an X-ray imaging system, the use of a test object, a computer program element, and a computer-readable medium. In order to provide a test object for quality assurance in X-ray imaging with a facilitated handling and improved evaluation process, a test object (30) for X-ray imaging is provided, comprising a plate structure (32) with at least a first layer (34) with a first material (36) with a first X-ray attenuation. The plate structure is provided at least on one side with a boundary profile (38), which boundary profile is arranged between the first layer with the first X-ray attenuation and an adjoining second layer (40) with a second X-ray attenuation, wherein the second X-ray attenuation is lower than the first X-ray attenuation. The boundary profile comprises a plurality of minima (44) and maxima points (48), which are arranged periodically. On the boundary profile, at least one intermediate value point (50) is provided between each adjacent minima and maxima point.</p>
申请公布号 WO2012104735(A1) 申请公布日期 2012.08.09
申请号 WO2012IB50022 申请日期 2012.01.03
申请人 KONINKLIJKE PHILIPS ELECTRONICS N.V.;PHILIPS INTELLECTUAL PROPERTY & STANDARDS GMBH;MAACK, HANNS-INGO 发明人 MAACK, HANNS-INGO
分类号 A61B6/00;G01T7/00 主分类号 A61B6/00
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