| 摘要 |
<p>Provided is a system for inspecting light transmitting board-like material, wherein the width of a region where a camera is disposed can be reduced, and images that reflect a chamfer width and a defect size more accurately can be photographed. A first light transmitting photographing camera (11a) is disposed so as to photograph an edge portion of a glass plate (20) from above, along an axis (42) formed by tilting a perpendicular line (41) on the upper surface of the glass plate (20) by a predetermined angle (?) to the side surface of the glass plate (20). Furthermore, a second light transmitting photographing camera (11b) is disposed so as to photograph the edge portion of the glass plate (20) from below along an axis (44) formed by tilting a perpendicular line (43) on the lower surface of the glass plate by a predetermined angle (?) to the side surface of the glass plate (20). When WS1 represents a value specified as the upper limit of the absolute value of a difference between the upper surface chamfer width and the lower surface chamfer width of the glass plate (20), and D represents the thickness of the glass plate, the angle (?) is tan-1(WS1/D) to 15°.</p> |
