发明名称 |
SEMICONDUCTOR DEVICE MANUFACTURING METHOD |
摘要 |
<P>PROBLEM TO BE SOLVED: To solve the problems such that: it is necessary to use an expensive special peeling solution requiring great care and increase in cost because reactive species of a photoresist created during processing fastens in processing of applying an aluminum material as metal wiring by dry etching; and the peeling solution damages the metal wiring, thereby deteriorating quality of the metal wiring. <P>SOLUTION: A semiconductor manufacturing method comprises: a metal wiring formation process which is a dry etching process using a reaction gas containing a chlorine gas or a chlorine; and a photoresist peeling process of peeling a photoresist. The photoresist peeling process includes three processes: a metal wiring exposure process of performing full ashing by using a mixed gas with a fluorocarbon gas containing oxygen and hydrogen; a cleaning process of cleaning by pure water; and an ashing process by a plasma using oxygen. Accordingly, processing by a special peeling solution becomes unnecessary and thereby high quality metal wiring can be formed at low cost. <P>COPYRIGHT: (C)2012,JPO&INPIT |
申请公布号 |
JP2012151199(A) |
申请公布日期 |
2012.08.09 |
申请号 |
JP20110007493 |
申请日期 |
2011.01.18 |
申请人 |
CITIZEN HOLDINGS CO LTD;CITIZEN WATCH CO LTD |
发明人 |
WADA TSUTOMU;SATO TOSHIHIRO |
分类号 |
H01L21/3065;H01L21/3213;H01L21/768 |
主分类号 |
H01L21/3065 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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