发明名称 APPARATUS FOR CLEANING WAFER
摘要 <P>PROBLEM TO BE SOLVED: To provide an apparatus for cleaning a wafer, which can evenly and uniformly clean a face of the wafer without being affected by attenuation of an ultrasonic wave and a nonuniform liquid current in a cleaning tank. <P>SOLUTION: The apparatus for cleaning a wafer comprises: the cleaning tank 11 filled with a cleaning liquid 2; a pedestal 12 which swingably holds the wafer 1 in the cleaning tank 11; and a wafer chuck 13 which moves the wafer 1 in a vertical direction while holding the wafer 1. In an operation for rotating the wafer 1, the wafer chuck 13 lifts the wafer 1 so that the wafer 1 is lifted from the pedestal 12 at a position at which a swing angle of the pedestal 12 becomes -&theta;, then only the pedestal 12 is rotated to tilt at an angle of +&theta;, the wafer chuck 13 releases the wafer 1, the wafer 1 is put on the pedestal 12 again and accordingly the wafer 1 is rotated in a circumferential direction. <P>COPYRIGHT: (C)2012,JPO&INPIT
申请公布号 JP2012151320(A) 申请公布日期 2012.08.09
申请号 JP20110009472 申请日期 2011.01.20
申请人 SUMCO CORP 发明人 MATSUNAGA YUHEI;OKITA KENJI
分类号 H01L21/304 主分类号 H01L21/304
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