| 摘要 |
<P>PROBLEM TO BE SOLVED: To provide a high temperature automatic flaw detection device improved in detection accuracy of a flaw part. <P>SOLUTION: The high temperature automatic flaw detection device is provided with a conveyance process 3 for conveying an analyte 2, a heating process 4 which is provided in the midway part of the conveyance process 3, in which the analyte 2 is passed through a high-frequency induction overheat coil, a surface layer part of the analyte 2 is heated by making an eddy current flow to the surface layer part, and a temperature change is given to the surface layer part, and a flaw detection process 5 for detecting a flaw in the surface layer part after heated by the heating process 4 by a detection device 7 and performing image processing on images acquired from the detection device 7 to determine the presence or absence of the flaw part of the surface layer part. In the flaw detection process 5, a descale device 10 for removing scale on the surface layer part and a detection device 6 for detecting a flaw part of the surface layer part before making the eddy current flow are installed in an order of the conveyance direction of the analyte 2 on a front side of the heating process 4, and the images of the surface layer part in the analyte 2 before and after making the eddy current flow, which are obtained from both of the detection devices 6 and 7 before and after the heating process 4, are analyzed to detect a flaw in the surface layer. <P>COPYRIGHT: (C)2012,JPO&INPIT |
