发明名称 DIFFERENTIAL PHASE-CONTRAST IMAGING WITH FOCUSSING DEFLECTION STRUCTURE PLATES
摘要 The present invention relates to X-ray differential phase-contrast imaging, in particular to a deflection device for X-ray differential phase-contrast imaging. In order to provide differential phase-contrast imaging with improved dose efficiency, a deflection device (28) for X-ray differential phase-contrast imaging is provided, comprising a deflection structure (41) with a first plurality (44) of first areas (46), and a second plurality (48) of second areas (50). The first areas are provided to change the phase and/or amplitude of an X- ray radiation; and wherein the second areas are X-ray transparent. The first and second areas are arranged periodically such that, in the cross section, the deflection structure is provided with a profile arranged such that the second areas are provided in form of groove-like recesses (54) formed between first areas provided as projections (56). The adjacent projections form respective side surfaces (58)partly enclosing the respective recess arranged in between. The side surfaces of each recess have a varying distance (60) across the depth (62) of the recess.
申请公布号 WO2012104770(A2) 申请公布日期 2012.08.09
申请号 WO2012IB50418 申请日期 2012.01.30
申请人 KONINKLIJKE PHILIPS ELECTRONICS N.V.;PHILIPS INTELLECTUAL PROPERTY & STANDARDS GMBH;ROESSL, EWALD;KOEHLER, THOMAS 发明人 ROESSL, EWALD;KOEHLER, THOMAS
分类号 G21K1/06 主分类号 G21K1/06
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