发明名称 OPERATING METHOD OF NONVOLATILE MEMORY DEVICE
摘要 PURPOSE: A method for operating a nonvolatile memory device is provided to improve program reliability of memory cells by programming the memory cells after string selection transistors and ground selection transistors are programmed. CONSTITUTION: First selection transistors are programmed(S110). Ground selection transistors are programmed(S120). A plurality of memory cells are programmed, read, and erased(S130). When the first selection transistors are programmed, a first voltage is supplied to a bit line connected to the first selection transistor which is programmed. A second voltage is supplied to a bit line connected to the first selection transistor which is not programmed. The second selection transistors are turned off. A first program voltage is supplied to the first selection line which is selected and a third voltage is supplied to the first selection line which is not selected.
申请公布号 KR20120088360(A) 申请公布日期 2012.08.08
申请号 KR20110009659 申请日期 2011.01.31
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 CHOE, BYEONG IN;SHIM, SUN IL;LEE, WOON KYUNG;JANG, JAE HOON
分类号 G11C16/12;G11C16/10;G11C16/30 主分类号 G11C16/12
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