发明名称 |
OPERATING METHOD OF NONVOLATILE MEMORY DEVICE |
摘要 |
PURPOSE: A method for operating a nonvolatile memory device is provided to improve program reliability of memory cells by programming the memory cells after string selection transistors and ground selection transistors are programmed. CONSTITUTION: First selection transistors are programmed(S110). Ground selection transistors are programmed(S120). A plurality of memory cells are programmed, read, and erased(S130). When the first selection transistors are programmed, a first voltage is supplied to a bit line connected to the first selection transistor which is programmed. A second voltage is supplied to a bit line connected to the first selection transistor which is not programmed. The second selection transistors are turned off. A first program voltage is supplied to the first selection line which is selected and a third voltage is supplied to the first selection line which is not selected.
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申请公布号 |
KR20120088360(A) |
申请公布日期 |
2012.08.08 |
申请号 |
KR20110009659 |
申请日期 |
2011.01.31 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
CHOE, BYEONG IN;SHIM, SUN IL;LEE, WOON KYUNG;JANG, JAE HOON |
分类号 |
G11C16/12;G11C16/10;G11C16/30 |
主分类号 |
G11C16/12 |
代理机构 |
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主权项 |
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地址 |
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