Pogo pin inserting device for testing semiconductor devices and method therefor

摘要

A pogo pin inserting device for testing a semiconductor device has a pin feeder for storing a plurality of pogo pins. A socket mounting device has a socket mounted thereon, wherein the plurality of pogo pins is loaded into the socket by the pin feeder. A magnetic field applying device applies a magnetic field to the socket to allow the plurality of pogo pins loaded onto the socket to be inserted into the socket in one of a forward or backward direction. An air blowing portion supplies the socket with air to eject backwardly inserted pogo pins from the socket.