发明名称 |
FABRICATING OF PHASE CHANGE RANDOM ACCESS MEMORY METHOD FOR FABRICATING |
摘要 |
<p>PURPOSE: A manufacturing method of a phase change memory device is provided to control generation of voids by including a single separation film which is formed into first to third separation films. CONSTITUTION: A plurality of phase change structures is formed on an upper portion of a semiconductor substrate(110). A first separation film is formed on the upper portion of the semiconductor substrate in order to be coated along a surface of the phase change structure. A second separation film(165) is formed on the upper portion of the semiconductor substrate on which the first separation film is formed. The first and second separation films are planarized in order to expose the surface of the phase change structure. A third separation film(167) is formed on the upper portion of the planarized semiconductor substrate.</p> |
申请公布号 |
KR20120087713(A) |
申请公布日期 |
2012.08.07 |
申请号 |
KR20110009078 |
申请日期 |
2011.01.28 |
申请人 |
SK HYNIX INC. |
发明人 |
SHIN, HEE SEUNG;CHEONG, JUNG TAIK |
分类号 |
H01L21/8247;H01L27/115 |
主分类号 |
H01L21/8247 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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