发明名称 Nonvolatile memory devices that utilize error correction estimates to increase reliability of error detection and correction operations
摘要 Example embodiments may provide a memory device and memory data reading method. The memory device according to example embodiments may include a multi-bit cell array, an error detector which may read a first data page from a memory page in the multi-bit cell array and may detect an error-bit of the first data page, and an estimator which may identify a multi-bit cell where the error-bit is stored and may estimate data stored in the identified multi-bit cell among data of a second data page. Therefore, the memory device and memory data reading method may have an effect of reducing an error when reading data stored in the multi-bit cell and monitoring a state of the multi-bit cell without additional overhead.
申请公布号 US8239747(B2) 申请公布日期 2012.08.07
申请号 US20080216744 申请日期 2008.07.10
申请人 CHO KYOUNG LAE;KIM JAE HONG;PARK YOON DONG;KONG JUN JIN;CHAE DONG HYUK;SAMSUNG ELECTRONICS CO., LTD. 发明人 CHO KYOUNG LAE;KIM JAE HONG;PARK YOON DONG;KONG JUN JIN;CHAE DONG HYUK
分类号 G06F11/00 主分类号 G06F11/00
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