发明名称 Contact patterning method with transition etch feedback
摘要 A method for forming a contact hole in a semiconductor device and related computer-readable storage medium are provided, the method and program steps of the medium including measuring a percentage of oxygen in an etching chamber, and controlling the percentage of oxygen in the etching chamber to enlarge a temporary inner diameter near a top of the contact hole.
申请公布号 US8236699(B2) 申请公布日期 2012.08.07
申请号 US201113021842 申请日期 2011.02.07
申请人 JEON BYUNG-GOO;PARK SUNG-CHUL;EDLEMAN NIKKI;GUTMANN ALOIS;CHEN FANG;INFINEON NORTH;SAMSUNG ELECTRONICS CO., LTD.;INTERNATIONAL BUSINESS MACHINES CORPORATION;CHARTERED SEMICONDUCTOR MANUFACTURING LTD.;INFINEON TECHNOLOGIES AG 发明人 JEON BYUNG-GOO;PARK SUNG-CHUL;EDLEMAN NIKKI;GUTMANN ALOIS;CHEN FANG
分类号 H01L21/311 主分类号 H01L21/311
代理机构 代理人
主权项
地址