发明名称 METHOD FOR PRODUCING SEMICONDUCTOR DEVICE, AND SEMICONDUCTOR DEVICE
摘要 This method for producing a semiconductor device having GaN (gallium nitride) configuring a semiconductor layer is provided with a gate insulating film formation step (F) for, using microwave plasma, forming on a nitride layer having GaN at least one film from among the group consisting of an SiO2 film and an Al2O3 film, and causing the formed film to be at least a portion of a gate insulating film.
申请公布号 WO2012102237(A1) 申请公布日期 2012.08.02
申请号 WO2012JP51348 申请日期 2012.01.23
申请人 TOHOKU UNIVERSITY;ADVANCED POWER DEVICE RESEARCH ASSOCIATION;TOKYO ELECTRON LIMITED;TERAMOTO, AKINOBU;KAMBAYASHI, HIROSHI;UEDA, HIROKAZU;MOROZUMI, YUICHIRO;HARADA, KATSUSHIGE;HASEBE KAZUHIDE;OHMI, TADAHIRO 发明人 TERAMOTO, AKINOBU;KAMBAYASHI, HIROSHI;UEDA, HIROKAZU;MOROZUMI, YUICHIRO;HARADA, KATSUSHIGE;HASEBE KAZUHIDE;OHMI, TADAHIRO
分类号 H01L29/78;H01L21/31;H01L21/316;H01L21/336;H01L21/338;H01L29/778;H01L29/786;H01L29/812 主分类号 H01L29/78
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