发明名称 RESIN, RESIST COMPOSITION, AND METHOD FOR PRODUCING RESIST PATTERN
摘要 <P>PROBLEM TO BE SOLVED: To provide a resist composition capable of producing a resist pattern with excellent CD uniformity (CDU). <P>SOLUTION: The resin includes a structural unit represented by formula (aa) and a structural unit represented by formula (ab), and the resin composition contains this resin and an acid generator, wherein R<SP POS="POST">aa1</SP>, R<SP POS="POST">ab1</SP>each represent hydrogen atom or methyl; R<SP POS="POST">aa2</SP>represents hydrogen atom or alkyl fluoride group; R<SP POS="POST">aa3</SP>represents alkyl fluoride group; R<SP POS="POST">aa4</SP>represents a monovalent group the bond of which with oxygen atom [O-R<SP POS="POST">aa4</SP>] is never cut by the action of an acid; n<SP POS="POST">aa1</SP>and n<SP POS="POST">ab1</SP>each represent 1 or 2; A<SP POS="POST">aa1</SP>represents hydrocarbon group; A<SP POS="POST">ab1</SP>represents hydrocarbon group or single bond; W<SP POS="POST">1</SP>represents alicyclic hydrocarbon group; A<SP POS="POST">ab2</SP>represents aliphatic hydrocarbon group; and R<SP POS="POST">ab2</SP>represents alkyl fluoride group or the like. <P>COPYRIGHT: (C)2012,JPO&INPIT
申请公布号 JP2012144699(A) 申请公布日期 2012.08.02
申请号 JP20110257188 申请日期 2011.11.25
申请人 SUMITOMO CHEMICAL CO LTD 发明人 ICHIKAWA KOJI;SHIGEMATSU JUNJI;HASHIMOTO KAZUHIKO
分类号 C08F220/26;C08F220/22;G03F7/004;G03F7/039;H01L21/027 主分类号 C08F220/26
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