| 摘要 |
<P>PROBLEM TO BE SOLVED: To provide a method, a system, and a device for testing a flash memory die. <P>SOLUTION: In a post-wafer-sorting stage of device manufacture, a plurality of flash memory devices which each include a flash controller die related to a common housing and at least one flash memory die are passed to a test process such as a batch test process or mass test process. During a test, at least one test program is executed which allows a flash controller on each flash controller die to test one or more flash memory dies of each flash device. Disclosed is a test system including at least 100 flash memory devices and a mass test board. Further, disclosed is a flash memory device which is operative such that a flash controller tests one or more flash memory dies. A model test includes a defective block test. <P>COPYRIGHT: (C)2012,JPO&INPIT |
