发明名称 METHOD FOR PRODUCING SEMICONDUCTOR DEVICE
摘要 <p>Provided is a method that is for producing a semiconductor device and that is provided with: a first sacrificial layer forming step for forming a first sacrificial layer that contacts at least a portion of a first semiconductor layer and that has a higher solid solubility of impurities contained in the first semiconductor layer than that of the first semiconductor layer; an annealing step for annealing the first sacrificial layer and the first semiconductor layer; an elimination step for eliminating the first sacrificial layer via a wet process; a step for forming an insulating layer that covers at least a portion of the first semiconductor layer and/or a step for etching a portion of the first semiconductor layer; and an electrode-forming step for forming an electrode layer that is electrically connected to the first semiconductor layer.</p>
申请公布号 WO2012102012(A1) 申请公布日期 2012.08.02
申请号 WO2012JP00405 申请日期 2012.01.23
申请人 ADVANCED POWER DEVICE RESEARCH ASSOCIATION;NATIONAL UNIVERSITY CORPORATION TOHOKU UNIVERSITY;KAMBAYASHI, HIROSHI;TERAMOTO, AKINOBU;OHMI, TADAHIRO 发明人 KAMBAYASHI, HIROSHI;TERAMOTO, AKINOBU;OHMI, TADAHIRO
分类号 H01L21/338;H01L21/28;H01L21/306;H01L21/3065;H01L21/308;H01L29/778;H01L29/78;H01L29/812 主分类号 H01L21/338
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