<p>Provided is a method that is for producing a semiconductor device and that is provided with: a first sacrificial layer forming step for forming a first sacrificial layer that contacts at least a portion of a first semiconductor layer and that has a higher solid solubility of impurities contained in the first semiconductor layer than that of the first semiconductor layer; an annealing step for annealing the first sacrificial layer and the first semiconductor layer; an elimination step for eliminating the first sacrificial layer via a wet process; a step for forming an insulating layer that covers at least a portion of the first semiconductor layer and/or a step for etching a portion of the first semiconductor layer; and an electrode-forming step for forming an electrode layer that is electrically connected to the first semiconductor layer.</p>
申请公布号
WO2012102012(A1)
申请公布日期
2012.08.02
申请号
WO2012JP00405
申请日期
2012.01.23
申请人
ADVANCED POWER DEVICE RESEARCH ASSOCIATION;NATIONAL UNIVERSITY CORPORATION TOHOKU UNIVERSITY;KAMBAYASHI, HIROSHI;TERAMOTO, AKINOBU;OHMI, TADAHIRO