| 摘要 |
<p>The invention relates to the method and the device for diagnosing plant growing conditions. The invention is aimed to detect the deficiency of the main chemical elements (Fe, B, Mn, Zn, Cu, Mo) during the vegetation period of the plant. The method and device for the diagnosing of plant growing conditions is based on the irradiation of the leaves of different age (1A, 1B, 1C, 1D,...) placed in separate chambers by visible and infrared light, and the spectrum analysis of the light reflected from the leaves. The estimation of the deficiency of micro elements and the diagnosis of the plant is performed according to the measured differences between the spectra of a light reflected from all the leaves of the plant.</p> |
